Several techniques for improving energy dependence of a commercial personal neutron dosemeter package based on PADC track detector
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Radiation
Reference15 articles.
1. Proton-recoil neuron dosimeter for personnel monitoring;Benton;Health Phys.,1981
2. A nuclear-track-recording polymer of unique sensitivity and resolution;Cartwright;Nucl. Instr. Meth.,1978
3. A CR-39 track image analyser for neutron spectrometry;d'Errico;Radiat. Meas.,1997
4. Response of solid state recorders to neutrons;Hooton;Nucl. Instr. Meth.,1982
5. Development of a passive fast-neutron spectrometer based on electrochemically etched CR-39 detectors with radiators and degraders;Matiullah;Nucl. Instr. Meth. Phys. Res.,1987
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1. Solid-state nuclear track detectors;Handbook of Radioactivity Analysis;2020
2. GENERALISATION OF RADIATOR DESIGN TECHNIQUES FOR PERSONAL NEUTRON DOSEMETERS BY UNFOLDING METHOD;Radiation Protection Dosimetry;2015-09-16
3. Thresholds of Etchable Track Formation and Chemical Damage Parameters in Poly(ethylene terephthalate), Bisphenol A polycarbonate, and Poly(allyl diglycol carbonate) Films at the Stopping Powers Ranging from 10 to 12,000 keV/µm;Japanese Journal of Applied Physics;2012-05-01
4. Thresholds of Etchable Track Formation and Chemical Damage Parameters in Poly(ethylene terephthalate), Bisphenol A polycarbonate, and Poly(allyl diglycol carbonate) Films at the Stopping Powers Ranging from 10 to 12,000 keV/$\mu$m;Japanese Journal of Applied Physics;2012-04-27
5. Solid-State Nuclear Track Detectors;Handbook of Radioactivity Analysis;2012
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