The effect of interface trapped charge on threshold voltage shift estimation for gamma irradiated MOS device
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Radiation
Reference31 articles.
1. Effects of TID on transistor parameters of dc-dc converters;Attia,2007
2. Modeling ionizing radiation effects in solid state materials and CMOS devices;Barnaby;IEEE Trans. Circuits Syst. I Reg. Pap.,2009
3. Mechanisms of enhanced radiation-induced degradation due to excess molecular hydrogen in bipolar oxides;Chen;IEEE Trans. Nucl. Sci.,2007
4. IC space radiation effects experimental simulation and estimation methods;Chumakov;Radiat. Meas.,1999
5. An evaluation of low-energy x-ray ad cobalt-60 irradiations of MOS transistors;Dozier;IEEE Trans. Nucl. Sci.,1987
Cited by 15 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Extensive thermal-range simulation study of interface traps and oxide charges in an oxide-optimized MOS-capacitive radiation sensor for space applications;Journal of the Korean Physical Society;2024-02-26
2. Total ionizing dose effect modeling method for CMOS digital-integrated circuit;Nuclear Science and Techniques;2024-02
3. Design and Optimization of MOS Capacitor based Radiation Sensor for Space Applications;Arabian Journal for Science and Engineering;2024-01-19
4. Ultrathin Crystalline Silicon Nano and Micro Membranes with High Areal Density for Low‐Cost Flexible Electronics;Small;2023-05-28
5. Experimental investigation into impacts of neutron irradiation on pMOS dosimeter behaviors;Radiation Measurements;2023-02
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3