Structural studies of amorphous semiconducting thin films using interference enhanced raman scattering-Reference-Cited by-同舟云学术

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Structural studies of amorphous semiconducting thin films using interference enhanced raman scattering

Published:1980-01 Issue: Volume:35-36 Page:1203-1208
ISSN:0022-3093
Container-title:Journal of Non-Crystalline Solids
language:en
Short-container-title:Journal of Non-Crystalline Solids

Author:

Tsai C.C.,Nemanich R.J.

Publisher

Elsevier BV

Subject

Materials Chemistry,Condensed Matter Physics,Ceramics and Composites,Electronic, Optical and Magnetic Materials

Reference14 articles.

1. Connell, G. A. N., Nemanich, R. J. and Tsai, C. C., (to be published).

2. Nemanich, R. J., Tsai, C. C. and Connell, G. A. N., (to be published).

3. Proc. of Conf. on Structure and Excitations in Amorphous Solids;Knights,1976

4. Proc. of Conf. on Structure and Excitations in Amorphous Solids;Lannin,1976

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