Small-angle X-ray diffraction studies on interface sharpness of amorphous Se/CdSe superlattices
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Condensed Matter Physics,Ceramics and Composites,Electronic, Optical and Magnetic Materials
Reference8 articles.
1. Jubilee Collection of Inst. of Solid State Phys.;Vateva;Bulg. Acad. of Sci.,1993
2. X-Ray Diffraction Investigation on Chalcogenide Amorphous Superlattices
3. Preparation and characterization of amorphous SeTe/CdSe superlattices and their constituent thin layers
4. Growth and structure of layered amorphous semiconductors
5. Structure of interfaces ina‐Si: H/a‐SiNx: H superlattices
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