Analytical Review of Direct Stem Imaging Techniques for Thin Samples-Reference-Cited by-同舟云学术

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Analytical Review of Direct Stem Imaging Techniques for Thin Samples

Published:2017 Issue: Volume: Page:75-184
ISSN:1076-5670
Container-title:Advances in Imaging and Electron Physics
language:
Short-container-title:

Author:

Lazić Ivan,Bosch Eric G.T.

Publisher

Elsevier

Reference43 articles.

1. Analysis of HR-STEM theory for thin specimen;Bosch;Ultramicroscopy,2015

2. The symmetry of electron diffraction zone axis patterns;Buxton;Philosophical Transactions of the Royal Society of London A: Mathematical, Physical and Engineering Sciences,1976

3. Scanning transmission electron microscopy of thin specimens;Cowley;Ultramicroscopy,1976

4. Differential phase contrast in a STEM;Dekkers;Optik,1974

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