BIST for network on chip communication infrastructure based on combination of extended IEEE 1149.1 and IEEE 1500 standards

Author:

Nourmandi-Pour Reza,Mousavian Nafiseh,Khadem-Zadeh Ahmad

Publisher

Elsevier BV

Subject

General Engineering

Reference56 articles.

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3. E.J. Marinissen, R. Arendsen, G. Bos, H. Dingemanse, M. Lousberg, C. Wouters, A Structured and Scalable Mechanism for Test Access to Embedded Reusable Cores, in: Proceedings ITC, 1998, pp. 284–293.

4. M. Nahvi, A. Ivanov, Packet Switching Communication-Based TAM for a SOC, ETW'01, 2001, pp. 81.

5. Power aware NoC reuse on the testing of core-based systems;Cota;Inter. Test Conf.,2003

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. A Programmable IEEE 1500-Compliant Wrapper for Testing of Word-Oriented Memory Cores;Journal of Circuits, Systems and Computers;2018-04-26

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