Statistical estimation of delay in nano-scale CMOS circuits using Burr Distribution-Reference-Cited by-同舟云学术

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Statistical estimation of delay in nano-scale CMOS circuits using Burr Distribution

Published:2018-09 Issue: Volume:79 Page:30-37
ISSN:0026-2692
Container-title:Microelectronics Journal
language:en
Short-container-title:Microelectronics Journal

Author:

Moshrefi Amirhossein^ORCID,Aghababa Hossein,Shoaei Omid

Publisher

Elsevier BV

Subject

General Engineering

Reference50 articles.

1. Variation-aware Adaptive Voltage Scaling for Digital CMOS Circuits;Wirnshofe,2013

2. Statistical Analysis and Optimization for VLSI: Timing and Power;Srivastava,2005

3. Design for Manufacturability and Statistical Design;Orshansky,2008

4. Analyzing the Impact of Process Variations on Parametric Measurements;Reda,2009

5. Bias Temperature Instability for Devices and Circuits;Grasser,2014

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