Possible acception criteria for structure functions-Reference-Cited by-同舟云学术

Possible acception criteria for structure functions

Published:2012-02 Issue:2 Volume:43 Page:164-168
ISSN:0026-2692
Container-title:Microelectronics Journal
language:en
Short-container-title:Microelectronics Journal

Author:

Szalai Albin,Székely Vladimir

Publisher

Elsevier BV

Subject

General Engineering

Reference9 articles.

1. Transient Measurement of the Junction-To-Case Thermal Resistance Using Structure Functions: Chances and Limits, 2008 Twenty-fourth Annual IEEE Semiconductor Thermal Measurement and Management Symposium;Schweitzer,2008

2. How to evaluate transient dual interface measurements of the Rth-JC of power semiconductor packages;Schweitzer,2009

3. On the representation of infinite-length distributed RC one-ports;Székely;IEEE Trans. Circuits Syst.,1991

4. Distributed RC networks. The Circuits and Filters Handbook—Feedback, Nonlinear, and Distributed Circuits;Székely,2009

5. Transmission Lines. The Circuits and Filters Handbook—Feedback, Nonlinear, and Distributed Circuits;Kryu Ishii,2009

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