Statistical yield improvement under process variations of multi-valued memristor-based memories
Author:
Funder
Zewail City of Science and Technology
AUC
STDF
Intel
Mentor Graphics
ITIDA
SRC
ASRT
NTRA
MCIT
Publisher
Elsevier BV
Subject
General Engineering
Reference36 articles.
1. Memristor-the missing circuit element;Chua;IEEE Trans. Circuits Theory,1971
2. The missing memristor found;Strukov;Nature,2008
3. Memristive switching mechanism for metal/oxide/metal nanodevices;Yang;Nat. Nanotechnol.,2008
4. How we found the missing memristor;Williams;IEEE Spectrum,2008
5. Dynamical properties and design analysis for nonvolatile memristor memories;Ho;IEEE Trans. Circuits Syst. I,2011
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