Improving reliability in NoCs by reconstructing location distribution of management cores-Reference-Cited by-同舟云学术

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Improving reliability in NoCs by reconstructing location distribution of management cores

Published:2019-08 Issue: Volume:90 Page:133-140
ISSN:0026-2692
Container-title:Microelectronics Journal
language:en
Short-container-title:Microelectronics Journal

Author:

Fu Fangfa,Lou Binglei,Chen Yukun,Wang Jinxiang

Funder

National Natural Science Foundation of China

Publisher

Elsevier BV

Subject

General Engineering

Reference30 articles.

1. Thousand core chips: a technology perspective;Borkar,2007

2. Trends of terascale computing chips in the next ten years;Lu,2009

3. Programming Many-Core Chips;Vajda,2011

4. Survey of network on chip (noc) architectures & contributions;Agarwal;Journal of engineering, Computing and Architecture,2009

5. d 2-lbdr: distance-driven routing to handle permanent failures in 2d mesh nocs;Bishnoi,2015

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Design of Fast Distribution Network Fault Location Algorithm Based on Multi-information Fusion;2023 International Conference on Power, Electrical Engineering, Electronics and Control (PEEEC);2023-09-25

2. Design of Fault Location Algorithm for Distribution Network Based on FTU;2023 International Conference on Telecommunications, Electronics and Informatics (ICTEI);2023-09-11

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