A new type of scanning probe microscope: combination between an electrometer and a THz microscope
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Published:2005-03
Issue:3-6
Volume:36
Page:592-595
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ISSN:0026-2692
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Container-title:Microelectronics Journal
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language:en
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Short-container-title:Microelectronics Journal
Author:
Kawano Y.,Okamoto T.
Subject
General Engineering
Cited by
1 articles.
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