A 12-bit single slope ADC with multi-step structure and ramp calibration technique for image sensors

Author:

Li Hao,Liu Dongsheng,Liang Yingxiang,Hu Ang,Nie Zheng,Zhang Chengcheng,Li Kaiyue,Niu Guangda,Gao Liang,Tang Jiang

Publisher

Elsevier BV

Subject

General Engineering

Reference19 articles.

1. Optics Imaging Devices: New Technologies and Applications;Khosla,2015

2. A 16-bit single-slope based pixel-level ADC for 15 μm-pitch 640×512 MWIR FPAs;Huang,2018

3. A high-speed, high-sensitivity digital CMOS image sensor with a global shutter and 12-bit column-parallel cyclic A/D converters;Furuta;IEEE J. Solid State Circ.,2007

4. A binocular CMOS range image sensor with bit-serial block-parallel interface using cyclic pipelined ADCs;Kato,2002

5. A high area-efficiency 14-bit SAR ADC with hybrid capacitor DAC for array sensors;Zhang;IEEE Trans. Circuits Syst. I, Reg. Papers,2020

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