Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference23 articles.
1. Single event transients in digital CMOS—a review;Cavrois;IEEE Trans. Nucl. Sci.,2013
2. Latch susceptibility to transient faults and new hardening approach;Omana;IEEE Trans. Comput.,2007
3. A methodology for characterization of SET propagation in SRAM-based FPGAs;Liang;IEEE Trans. Nucl. Sci.,2016
4. DONUT: a double node upset tolerant latch;Eftaxiopoulos;IEEE Computer Society Annual Symposium on VLSI,2015
5. Radiation hardened latch designs for double and triple node upsets;Watkins;IEEE Transactions on Emerging Topics in Computing,2020