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Design of threshold voltage insensitive pixel driver circuitry using a-IGZO TFT for AMOLED displays

  • Published:2020-07 Issue: Volume:101 Page:104819
  • ISSN:0026-2692
  • Container-title:Microelectronics Journal
  • language:en
  • Short-container-title:Microelectronics Journal

Author:

Sodhani Aditya,Kandpal Kavindra

Publisher

Elsevier BV

Subject

General Engineering

Reference22 articles.

1. Design of flat-panel displays based on organic light-emitting devices;Gu;IEEE J. Sel. Top. Quant. Electron.,1998

2. Extraction of electron band mobility in amorphous silicon thin-film transistors;Lee;Jpn. J. Appl. Phys.,2012

3. Growth of IGZO thin films and fabrication of transparent thin film transistor by RF magnetron sputtering;Sanal,2013

4. Simulation of the influence of the gate dielectric on amorphous indium-gallium-zinc oxide thin-film transistor reliability;Labed;J. Comput. Electron.,2019

5. Amorphous In-Ga-Zn-O Thin Film Transistor for Future Optoelectronics;Fung,2010

Cited by 21 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Driving scheme for residual image reduction in active-matrix organic light-emitting diodes display;Microelectronics Journal;2024-09

2. A Highly Reliable, Stacked-Capacitor, Voltage-Programmed Pixel Circuit Using a-IGZO TFTs for AMOLED Displays;Journal of Circuits, Systems and Computers;2024-05-25

3. Field Stack Lighting Driving Method for Low Power Organic Light Emitting Diode-on-Silicon Microdisplay;IEEE Journal of Selected Topics in Quantum Electronics;2024-03

4. An a-IGZO TFT Pixel Circuit to Compensate Electrical Characteristics Variation and OLED Degradation;Proceedings of the 2023 7th International Conference on Electronic Information Technology and Computer Engineering;2023-10-20

5. Long-Term Recovery Behavior in InSnZnO Thin-Film Transistors after Negative Bias Stress;2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA);2023-07-24
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