A low-cost configurability test strategy for an embedded analog circuit-Reference-Cited by-同舟云学术

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A low-cost configurability test strategy for an embedded analog circuit

Published:2012-11 Issue:11 Volume:43 Page:745-755
ISSN:0026-2692
Container-title:Microelectronics Journal
language:en
Short-container-title:Microelectronics Journal

Author:

Laprovitta Agustin,Peretti Gabriela,Romero Eduardo,Mourad Samiha

Publisher

Elsevier BV

Subject

General Engineering

Reference23 articles.

1. Introduction;Vinnakota,1998

2. Integrated Circuit Test Engineering. Modern Techniques;Grout,2006

3. Analog testing by characteristic observation inference;Lindermeir;IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.,1999

4. Applying the oscillation test strategy to FPAA's configurable analog blocks;Balen;J. Electron. Test. Theory Appl.,2005

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3. Dimension-Reduced Analog—Digital Mixed Measurement Method of Inductive Proximity Sensor;Sensors;2017-06-30

4. A Digital Testing Strategy for Characterizing an Analog Circuit Block;IEEE Transactions on Instrumentation and Measurement;2016-06

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