On the limitations of transimpedance amplifiers as tools for low-frequency noise characterization-Reference-Cited by-同舟云学术

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On the limitations of transimpedance amplifiers as tools for low-frequency noise characterization

Published:2014-02 Issue:2 Volume:45 Page:152-158
ISSN:0026-2692
Container-title:Microelectronics Journal
language:en
Short-container-title:Microelectronics Journal

Author:

Borgarino Mattia,Betti Beneventi Giovanni^ORCID,Doga Valerio,Pavan Paolo

Publisher

Elsevier BV

Subject

General Engineering

Reference31 articles.

1. Electronic Noise and Fluctuations in Solids;Kogan,1996

2. Low-frequency fluctuations in solids;Dutta;Rev. Mod. Phys.,1981

3. Noise: Sources, Characterization, Measurement, Information and System Sciences Series;Van der Ziel,1970

4. Noise as a diagnostic tool for quality and reliability of electronic devices;Vandamme;IEEE Trans. Electron Devices,1994

5. Low-frequency noise as a tool to study disordered materials;Weissman;Annu. Rev. Mater. Sci.,1996

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