Test power and area optimized logic built-in self-test with higher fault coverage for automobile SoCs

Author:

Shivakumar VishnupriyaORCID,Senthilpari C.,Yusoff ZubaidaORCID

Funder

Multimedia University

Publisher

Elsevier BV

Subject

General Engineering

Reference32 articles.

1. Advanced uniformed test approach for automotive SoCs;Kogan;Proc. - Int. Test Conf.,2019

2. Test sequence-optimized BIST for automotive applications;Kaczmarek;Proc. Eur. Test Work.,2020

3. On new class of test points and their applications;Rajski;Proc. - Int. Test Conf.,2019

4. A survey of technical trend of ADAS and autonomous driving;Okuda;Proc. Tech. Progr. - 2014 Int. Symp. VLSI Technol. Syst. Appl. VLSI-TSA,2014

5. A quantitative approach to SoC functional safety analysis;Chonnad;Int. Syst. Chip Conf.,2019

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