Subthreshold model of asymmetric GAA junctionless FETs with scaled equivalent oxide thickness

Author:

Kumar Ajit,Tiwari Pramod Kumar,Roy J.N.

Funder

Ministry of Electronics and Information technology

Publisher

Elsevier BV

Subject

General Engineering

Reference34 articles.

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4. On and off state hot carrier reliability in junctionless high-K MG gate-all-around nanowires;Cho;IEEE Int Electron Dev Meet (IEDM),2015

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