1. An improved de-embedding technique for on-wafer high-frequency characterization;Koolen,1991
2. Comparison of on-chip de-embedding methods with 28-nm FDSOI MOSFETs up to 110-GHz;Lee,2019
3. A novel approach to extracting small-signal model parameters of silicon MOSFET's;Lee;IEEE Microw. Guid. Wave Lett.,1997
4. A new small-signal parameter extraction approach for SOI MOSFET;Lao,2001
5. Small-signal modeling of mm-wave MOSFET up to 110 GHz in 22nm FDSOI technology;Le,2019