Reduction of off-state drain current in AlN/βGa2O3 HEMT by trap state engineering

Author:

Tomar Aishwarya,Mourya Satyendra Kumar,Kumar RahulORCID

Funder

Birla Institute of Technology & Science Pilani

Publisher

Elsevier BV

Reference35 articles.

1. A physics-based analytical model for 2DEG charge density in AlGaN/GaN HEMT devices;Khandelwal;IEEE Trans. Electron Devices,2011

2. Properties and perspectives of ultrawide bandgap Ga2O3 in optoelectronic applications;Ping;Chinese J. Phys.,2021

3. Recent progress of Ga2O3-based gas sensors;Zhai;Ceram. Int.,2022

4. High-performance harsh-environment-resistant GaOX solar-blind photodetectors via defect and doping engineering;Hou;Adv. Mater.,2022

5. Theoretical investigation of thickness variation on Ga2O3 MESFET: Depletion to enhancement mode transition;Rawtani,2023

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