An IEEE 1149.1-based BIST method for at-speed testing of inter-switch links in network on chip

Author:

Nourmandi-Pour Reza,Khadem-Zadeh Ahmad,Masoud Rahmani Amir

Publisher

Elsevier BV

Subject

General Engineering

Reference46 articles.

1. Communication-based design for nanoscales SOCs;Orgas,2006

2. Design, synthesis, and test of networks on chips;Pande;IEEE Des. Test Comput.,2005

3. E. J. Marinissen, R. Arendsen, G. Bos, H. Dingemanse, M. Lousberg, C. Wouters, A structured and scalable mechanism for test access to embedded reusable cores, in: proceedings of the ITC, 1998, pp. 284–293.

4. Packet switching communication-based TAM for a SOC;Nahvi;ETW'01,2001

5. Power aware NoC reuse on the testing of core-based systems;Cota;Int. Test Conf.,2003

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