Low voltage CCD image sensor with optimized reset operation-Reference-Cited by-同舟云学术

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Low voltage CCD image sensor with optimized reset operation

Published:2006-08 Issue:8 Volume:37 Page:778-782
ISSN:0026-2692
Container-title:Microelectronics Journal
language:en
Short-container-title:Microelectronics Journal

Author:

Park Sangsik,Uh Hyungsoo,Park Soeun

Publisher

Elsevier BV

Subject

General Engineering

Reference17 articles.

1. CMOS image sensor: electronic camera-on-a-chip;Fossum;IEEE Trans. Electron Devices,1997

2. Hot-electron affects in MOSFET's;Hu;IEDM Tech. Dig.,1983

3. Damage generation and location in n- and p-MOSFETs biased in the substrate-enhanced gate current regime;Driussi;IEEE Trans. Electron Devices,2002

4. Mechanisms for hot carrier induced degradation in reoxidized nitrided oxide n-MOSFET's under combined AC/DC stressing;Ma;IEEE Trans. Electron Devices,1993

5. Hot electron induced MOSFET degradation—model, monitor, and improvement;Hu;IEEE Trans. Electron Devices,1985

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1. Review of Recent Developments in Sensing Materials;Comprehensive Materials Processing;2014

2. Oxide Ultrathin Films in Sensor Applications;Oxide Ultrathin Films;2012-01-10

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