Plasma mediated ns-laser erosion of SiC monitored using Raman spectroscopy and in-operando LIBS
Author:
Funder
Ministry of Science and Technology
Publisher
Elsevier BV
Reference48 articles.
1. A survey of wide bandgap power semiconductor devices;Millan;IEEE Trans. Power. Electron.,2014
2. Status of silicon carbide (SIC) as a wlde-bandgap semiconductor for high-temperature applications: a review;CASADY;Solid. State Electron.,1996
3. Spectral broadening induced by intense ultra-short pulse in 4H-SiC crystals;Xu;Chinese Phys. B,2016
4. Machining processes of silicon carbide: a review;Pawar;Rev.Adv. Mater. Sci.,2017
5. Machined quality prediction and optimization for micro-EDM drilling of semi-conductive SiC wafer;Cao;Mater. Sci. Semicond. Process.,2024
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