Electromagnetic interference shielding performance and structure of multilayered NiFe/Cu thin films: Effects of impedance and defects
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Published:2024-07
Issue:
Volume:50
Page:104449
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ISSN:2468-0230
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Container-title:Surfaces and Interfaces
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language:en
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Short-container-title:Surfaces and Interfaces
Author:
Kwon Hyun Jun,
Park Jong-Hwan,
Park JungHo,
Shin Se Hee,
Kim Ki HyeonORCID,
Suh Su JeongORCID