Overlap and rotate - a simple method for predicting out-of-plane and in-plane orientations of heteroepitaxial thin films-Reference-Cited by-同舟云学术

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Overlap and rotate - a simple method for predicting out-of-plane and in-plane orientations of heteroepitaxial thin films

Published:2024-03 Issue: Volume:46 Page:104129
ISSN:2468-0230
Container-title:Surfaces and Interfaces
language:en
Short-container-title:Surfaces and Interfaces

Author:

Tokarský Jonáš^ORCID,Molek Jonáš^ORCID

Publisher

Elsevier BV

Reference34 articles.

1. Thin Films;Ares,2021

2. Epitaxy;Miglio,2005

3. Triaxially oriented growth of CuO on MgO (001): x-ray diffraction studies of pure CuO films and inclusions in superconducting Y-Ba-Cu-O films prepared by MOCVD;Watson;Thin Solid Films,1994

4. Growth of c-oriented ZnO films on (001) SrTiO3 substrates by MOCVD;Jia;J. Cryst. Growth,2008

5. Microwave-assisted hydrothermally grown epitaxial ZnO films on (111) MgAl2O4 substrate;Liew;J. Solid State Chem.,2012

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