Funder
Hrvatska Zaklada za Znanost
European Social Fund
European Regional Development Fund
Elettra Sincrotrone Trieste SCpA
European Commission
Subject
Surfaces, Coatings and Films,General Physics and Astronomy,Condensed Matter Physics,Surfaces and Interfaces,General Chemistry
Reference32 articles.
1. Determination of thickness and optical properties of tantalum oxide thin-films by spectroscopic ellipsometry;Chananonnawathorn;Adv. Mater. Res.,2014
2. Film thickness measurement by optical profilometer MicroProf® FRT;Siderov;Bulg. Chem. Commun., Spec. Issue B,2013
3. A comparison between pixe and rbs thin-film thickness measurements in binary targets;Oliver;Nucl. Instrum. Methods Phys. Res., Sect. B,1987
4. Study of thin-film thickness and density by high-resolution Rutherford backscattering spectrometry and X-ray reflectivity;Kitahara;Trans. Mat. Res. Soc. Japan,2009
5. Elements of Modern X-ray Physics;Als-Nielsen,2011
Cited by
7 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献