Statistical emission of electrons from nanocrystalline silicon quantum dot memory nodes in a few-electron MOSFET memory device
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Condensed Matter Physics,General Chemistry
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1. Embedded silicon nanocrystal interface structure and strain;Journal of Nanoparticle Research;2018-01
2. Effect of stress and interface defects on photoluminescence of Si nano-crystals embedded in SiO2;SPIE Proceedings;2013-06-22
3. Tight-binding versus effective mass approximation calculation of electronic structures of semiconductor nanocrystals and nanowires;Computational Materials Science;2008-11
4. Simple one-dimensional model for electronic structure calculation of unbiased and biased silicon quantum dots in Coulomb blockade applications;Journal of Applied Physics;2003
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