Determination of trap depths associated with TL peaks in synthetic quartz (350

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Determination of trap depths associated with TL peaks in synthetic quartz (350–550 K)

Published:1997-04 Issue:2 Volume:27 Page:185-191
ISSN:1350-4487
Container-title:Radiation Measurements
language:en
Short-container-title:Radiation Measurements

Author:

Petrov S.A.,Bailiff I.K.

Publisher

Elsevier BV

Subject

Instrumentation,Radiation

Reference26 articles.

1. Point Defects in Materials;Agullo-Lopez,1988

2. Thermoluminescence Dating;Aitken,1985

3. A rapid scanning interference spectrometer: application to low-level thermoluminescence emission;Bailiff;Journal of Physics E: Scientific Instruments,1977

4. Computer controlled TL apparatus;Bailiff;Nuclear Tracks and Radiation Measurements,1988

5. The predose technique;Bailiff;Radiation Measurements,1994

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