Detection threshold in muscovite mica: Influence of the observation tool-Reference-Cited by-同舟云学术

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Detection threshold in muscovite mica: Influence of the observation tool

Published:1999-06 Issue:1-6 Volume:31 Page:233-236
ISSN:1350-4487
Container-title:Radiation Measurements
language:en
Short-container-title:Radiation Measurements

Author:

Boichot S.,Fromm M.,Savall C.,Palmino F.,Labrune J.C.,Chambaudet A.

Publisher

Elsevier BV

Subject

Instrumentation,Radiation

Reference12 articles.

1. Ion track diameters in mica studied with Scanning Force Microscopy;Ackermann;Nucl. Instr. Meth.,1996

2. Detection threshold in polymers;Bernaola;Nucl. Tracks Radiat. Meas.,1993

3. Atomic Force microscopy;Binnig;Phys. Rev. Lett.,1992

4. Relation Between the Basic Phenomena and the Observed Damage;Bouffard;Nucl. Instr. Meth.,1996

5. Atomic Force Microscope Study of Etched Tracks of Low-Energy Heavy Ions in Mica;Coleman;Surface Science,1993

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The nanostructure formation on muscovite mica surface induced by intermediate-energy ions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2013-07

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