Nuclear Processes and Soft Fails in Microelectronics
Author:
Publisher
Elsevier BV
Subject
Nuclear and High Energy Physics
Reference29 articles.
1. Single-Event Upsets in Microelectronics
2. Single-Event Upsets in Microelectronics: Fundamental Physics and Issues
3. Alpha-particle-induced soft errors in dynamic memories
4. Effect of Cosmic Rays on Computer Memories
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1. GEANT4 simulation of nuclear interaction induced soft errors in digital nanoscale electronics: Interrelation between proton and heavy ion impacts;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2019-01
2. Ionization effects coupled with the residual products of nuclear reactions induced by cosmic protons in the metallization layers of modern 3D integrated-circuit assemblies;Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques;2014-11
3. Physical basis of radiation protection in space travel;Reviews of Modern Physics;2011-11-08
4. Methodology of Soft Error Rate Computation in Modern Microelectronics;IEEE Transactions on Nuclear Science;2010-12
5. SEMM-2: A new generation of single-event-effect modeling tools;IBM Journal of Research and Development;2008-05
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