Simulation of ion beam and optimization of orthogonal tandem ion trap/reflector time-of-flight mass spectrometry-Reference-Cited by-同舟云学术

Simulation of ion beam and optimization of orthogonal tandem ion trap/reflector time-of-flight mass spectrometry

Published:2002-01 Issue:1 Volume:213 Page:45-62
ISSN:1387-3806
Container-title:International Journal of Mass Spectrometry
language:en
Short-container-title:International Journal of Mass Spectrometry

Author:

Marinach C.,Brunot A.,Beaugrand C.,Bolbach G.,Tabet J.C.

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Instrumentation

Reference51 articles.

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