A simple closed-form expression for the X-ray reflectivity from multilayers with cumulative roughness
Author:
Publisher
Elsevier BV
Subject
General Engineering
Reference20 articles.
1. Surface Studies of Solids by Total Reflection of X-Rays
2. Layered synthetic microstructures as Bragg diffractors for X rays and extreme ultraviolet: theory and predicted performance
3. Metallic multilayers for x rays using classical thin-film theory
4. X‐ray scattering from interfacial roughness in multilayer structures
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