Chemical characterization by XPS of Cu/Ge ohmic contacts to n-GaAs-Reference-Cited by-同舟云学术

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Chemical characterization by XPS of Cu/Ge ohmic contacts to n-GaAs

Published:2007-03 Issue:11 Volume:253 Page:5062-5066
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

López M.C.,Galiana B.,Algora C.,Rey-Stolle I.,Gabas M.,Ramos-Barrado J.R.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference23 articles.

1. Physics of Optoelectronic Devices;Chuang,1995

2. Solar Cells and their Applications;Partain,1995

3. Influence of series resistance on guidelines for manufacture of concentrator p-on-n GaAs solar cells

4. Solar Energy Mater;Galiana;Sol. Cells,2006

5. A survey of ohmic contacts to III-V compound semiconductors

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