Effect of nitrogen incorporation on the structural, optical and dielectric properties of reactive sputter grown ITO films-Reference-Cited by-同舟云学术

Effect of nitrogen incorporation on the structural, optical and dielectric properties of reactive sputter grown ITO films

Published:2014-09 Issue: Volume:313 Page:311-319
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Gartner M.^ORCID,Stroescu H.,Marin A.,Osiceanu P.,Anastasescu M.,Stoica M.,Nicolescu M.,Duta M.,Preda S.,Aperathitis E.^ORCID,Pantazis A.,Kampylafka V.,Modreanu M.,Zaharescu M.

Funder

Romanian PN-II-ID-PCE-2011-3-0446 project

Romanian Government

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference39 articles.

1. Transparent conductors as solar energy materials: A panoramic review

2. Transparent and conducting ITO films: new developments and applications

3. On the synthesis of ultra smooth ITO thin films by conventional direct current magnetron sputtering

4. Evaporated Sn‐doped In2O3films: Basic optical properties and applications to energy‐efficient windows

5. rf-Magnetron sputtered ITO thin films for improved heterojunction solar cell applications

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