Reflectance anisotropies of polycrystalline Ce<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si49.svg" display="inline" id="d1e1576"><mml:msub><mml:mrow /><mml:mrow><mml:mn>1</mml:mn><mml:mo>−</mml:mo><mml:mi>x</mml:mi></mml:mrow></mml:msub></mml:math> Gd<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si41.svg" display="inline" id="d1e1588"><mml:msub><mml:mrow /><mml:mrow><mml:mi>x</mml:mi></mml:mrow></mml:msub></mml:math> O<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si51.svg" display="inline" id="d1e1596"><mml:msub><mml:mrow /><mml:mrow><mml:mn>2</mml:mn><mml:mo>−</mml:mo><mml:mi>x</mml:mi><mml:mo>/</mml:mo><mml:mn>2</mml:mn></mml:mrow></mml:msub></mml:math>/ Si<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si35.svg" display="inline" id="d1e1613"><mml:mrow><mml:mo>(</mml:mo><mml:mn>001</mml:mn><mml:mo>)</mml:mo></mml:mrow></mml:math> interfaces-Reference-Cited by-同舟云学术

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Reflectance anisotropies of polycrystalline Ce1−x Gdx O2−x/2/ Si(001) interfaces

Published:2023-12 Issue: Volume:639 Page:158161
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Hernández-Arteaga J.G.R.,Rodríguez A.G.^ORCID,Vazquez-Miranda S.^ORCID,Rosillo-Orozco L.^ORCID,Hingerl Kurt^ORCID,Balderas-Navarro R.E.^ORCID

Funder

Consejo Nacional de Ciencia y Tecnología

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference27 articles.

1. Hybrid functionals applied to rare-earth oxides: The example of ceria;Silva;Phys. Rev. B,2007

2. Electronic, bonding, and optical properties of CeO2 and Ce2o3 from first principles;Skorodumova;Phys. Rev. B,2001

3. Tuning LDA+U for electron localization and structure at oxygen vacancies in ceria;Kullgren;J. Chem. Phys.,2007

4. Chemical solution deposition of pure and Gd-doped ceria thin films: Structural, morphological, and optical properties;Zarkova;Ceram. Int.,2017

5. A spectroscopic ellipsometry study of cerium dioxide thin films grown on sapphire by rf magnetron sputtering;Guo;J. Appl. Phys.,1995

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