Microstructural and electrical investigation of polymorph stabilization and multistate transition in interface engineered epitaxial VO2 films
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Reference71 articles.
1. The two components of the crystallographic transition in VO2;Goodenough;J. Solid State Chem.,1971
2. Growth and characterization of vanadium dioxide thin films prepared by reactive-biased target ion beam deposition;West;J. Vac. Sci. Technol. A,2008
3. Reversible nanomodulation of thin vanadium dioxide films by a tip-induced electric field;Zhang;ACS Appl. Electronic Mater.s,2022
4. The origin of the thermochromic property changes in doped vanadium dioxide;Koch;ACS Appl. Mater. Interfaces,2022
5. Joule heating-induced metal-insulator transition in epitaxial VO2/TiO2 devices;Li;ACS Appl. Mater. Interfaces,2016
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