Comparison of intrinsic zero-energy loss and Shirley-type background corrected profiles of XPS spectra for quantitative surface analysis: Study of Cr, Mn and Fe oxides-Reference-Cited by-同舟云学术

Comparison of intrinsic zero-energy loss and Shirley-type background corrected profiles of XPS spectra for quantitative surface analysis: Study of Cr, Mn and Fe oxides

Published:2008-06 Issue:16 Volume:254 Page:5141-5148
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Oku Masaoki,Suzuki Shigeru,Ohtsu Naofumi,Shishido Toetsu,Wagatsuma Kazuaki

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference36 articles.

1. Universality Classes of Inelastic Electron Scattering Cross-sections

2. Background subtraction

3. Quantitative XPS of NiO, CoO and MnO. The effects of elastic and inelastic electron scattering

4. On background subtraction for quantitative analysis of X-ray photoelectron spectra of rare earth fluorides

5. Background removal in x-ray photoelectron spectroscopy: Relative importance of intrinsic and extrinsic processes

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