Surface modification of Sylgard 184 polydimethylsiloxane by 254nm excimer radiation and characterization by contact angle goniometry, infrared spectroscopy, atomic force and scanning electron microscopy-Reference-Cited by-同舟云学术

Surface modification of Sylgard 184 polydimethylsiloxane by 254nm excimer radiation and characterization by contact angle goniometry, infrared spectroscopy, atomic force and scanning electron microscopy

Published:2008-06 Issue:17 Volume:254 Page:5314-5318
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Waddell Emanuel A.,Shreeves Stephen,Carrell Holly,Perry Christopher,Reid Branden A.,McKee James

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference24 articles.

1. Hydrophobicity changes in silicone rubbers

2. Solvent Compatibility of Poly(dimethylsiloxane)-Based Microfluidic Devices

3. Replication of Vertical Features Smaller than 2 nm by Soft Lithography

4. What is silicone?

5. Hydrophobic recovery of UV/ozone treated poly(dimethylsiloxane): adhesion studies by contact mechanics and mechanism of surface modification

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