Enhancing reliability in oxide-based memristors using two-dimensional transition metal dichalcogenides
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Published:2025-01
Issue:
Volume:679
Page:161216
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ISSN:0169-4332
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Container-title:Applied Surface Science
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language:en
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Short-container-title:Applied Surface Science
Author:
Lee Donghyeon,
Kim Seung-Mo,
Park Jun-Cheol,
Jung Yoonsung,
Lee Soyeon,
Lee Byoung Hun,
Lee SanghanORCID