Author:
Kudriavtsev Yu.,Villegas A.,Godines A.,Asomoza R.
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Reference12 articles.
1. Secondary Ion Mass Spectrometry, A Practical Handbook for Depth Profiling and Bulk Impurity Analysis;Wilson,1989
2. Proceedings of V International Conference on Secondary Ion Mass Spectrometry, SIMS V;Scilla,1986
3. Proceedings of VI International Conference on Secondary Ion Mass Spectrometry, SIMSVI;Clegg,1988
4. The sources for contaminants in the trace analysis of carbon in GaAs by secondary ion mass spectrometry
5. Improved quantification and detection limits for oxygen analysis in AlxGa1−x As/GaAs multilayers with secondary ion mass spectroscopy
Cited by
12 articles.
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