Author:
Busch Ingo,Liu Wende,Chen Chi,Luo Zhiyong,Koenders Ludger
Funder
State Key Lab of Digital Manufacturing Equipment & Technology
National Institute of Metrology
Committee of National Optical Metrological technology
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Cited by
4 articles.
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