Pulsed laser ablation of indium tin oxide in the nano and femtosecond regime: Characterization of transient species-Reference-Cited by-同舟云学术

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Pulsed laser ablation of indium tin oxide in the nano and femtosecond regime: Characterization of transient species

Published:2006-04 Issue:13 Volume:252 Page:4632-4636
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

De Bonis A.,Galasso A.,Marotta V.,Orlando S.,Santagata A.,Teghil R.,Veronesi S.,Villani P.,Giardini A.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference27 articles.

1. Surface processes in the detection of reducing gases with SnO2-based devices

2. Highly conducting indium tin oxide films grown by ultraviolet-assisted pulsed laser deposition at low temperatures

3. Origin of characteristic grain-subgrain structure of tin-doped indium oxide films

4. Properties of indium tin oxide (ITO) films prepared by r.f. reactive magnetron sputtering at different pressures

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