Phase transition analysis of thermochromic VO2 thin films by temperature-dependent Raman scattering and ellipsometry-Reference-Cited by-同舟云学术

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Phase transition analysis of thermochromic VO2 thin films by temperature-dependent Raman scattering and ellipsometry

Published:2018-10 Issue: Volume:456 Page:545-551
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Huang Ying,Zhang Dongping,Liu Yi,Jin Jingcheng,Yang Yu,Chen Tao,Guan Huan,Fan Ping,Lv Weizhong

Funder

Shenzhen Science and Technology

National Natural Science

Guangdong Science and Technology

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference41 articles.

1. Femtosecond structural dynamics in VO2 during an ultrafast solid-solid phase transition;Cavalleri;Phys. Rev. Lett.,2001

2. Influence of lattice distortion on phase transition properties of polycrystalline VO2 thin film;Lin;Appl. Surf. Sci.,2016

3. Current-induced metal-insulator transition in VOx thin film prepared by rapid-thermal-annealing;Cho;Thin. Solid Films,2006

4. Photoinduced metallic state in VO2 proved by the terahertz pump-probe spectroscopy;Nakajima;Appl. Phys. Lett.,2008

5. Distinctive finite size effects on the phase diagram and metal–insulator transitions of tungsten-doped vanadium(IV) oxide;Whittaker;J. Mater. Chem.,2011

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