Use of XPS to clarify the Hall coefficient sign variation in thin niobium layers buried in silicon-Reference-Cited by-同舟云学术

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Use of XPS to clarify the Hall coefficient sign variation in thin niobium layers buried in silicon

Published:2017-03 Issue: Volume:399 Page:32-40
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Demchenko Iraida N.,Lisowski Wojciech,Syryanyy Yevgen,Melikhov Yevgen,Zaytseva Iryna,Konstantynov Pavlo,Chernyshova Maryna,Cieplak Marta Z.

Funder

EAgLE project

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference39 articles.

1. Electrical characteristics of rf sputtered single crystal niobium films;Mayadas;J. Appl. Phys.,1972

2. TC suppression and critical fields in thin superconducting Nb films;Quateman;Phys. Rev. B,1986

3. Superconducting tunneling in ultrathin Nb films;Park;Phys. Rev. Lett.,1986

4. Superconducting transition fluctuation, and vortex motion in a two-dimensional single-crystal Nb film;Hsu;Phys. Rev. B,1992

5. Superconductivity and electrical properties in single-crystalline ultrathin Nb films grown by molecular-beam epitaxy;Yoshii;Phys. Rev. B,1995

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5. Effect of rapid thermal annealing on damage of silicon matrix implanted by low-energy rhenium ions;Journal of Alloys and Compounds;2020-12

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