Density-functional-theory approach to determine band offsets and dielectric breakdown properties across metal/crystal oxide and metal/amorphous oxide interfaces: A case study of Al/SiO2-Reference-Cited by-同舟云学术

Density-functional-theory approach to determine band offsets and dielectric breakdown properties across metal/crystal oxide and metal/amorphous oxide interfaces: A case study of Al/SiO2

Published:2019-07 Issue: Volume:483 Page:616-625
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Huang Jianqiu^ORCID,Lin Fei,Hin Celine

Funder

U.S. Air Force

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference57 articles.

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