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Measurement of thin film magnetostriction using field-dependent atomic force microscopy

  • Published:2020-09 Issue: Volume:525 Page:146514
  • ISSN:0169-4332
  • Container-title:Applied Surface Science
  • language:en
  • Short-container-title:Applied Surface Science

Author:

Coïsson Marco,Hüttenes Wilhelm,Cialone Matteo,Barrera Gabriele,Celegato Federica,Rizzi Paola,Barber Zoe H.,Tiberto Paola

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Quantitative profilometric measurement of magnetostriction in thin-films;Applied Surface Science;2024-07

2. Magneto-mechanically induced antimicrobial properties of cone-like shaped surfaces;Applied Materials Today;2023-10

3. Magnetic Force Microscopy in Physics and Biomedical Applications;Magnetochemistry;2022-04-09

4. Nanomaterials Characterisation through Magnetic Field Dependent AFM;Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization;2022-01-07
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