Quantitative analysis of nano-defects in thin film encapsulation layer by Cu electrodeposition-Reference-Cited by-同舟云学术

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Quantitative analysis of nano-defects in thin film encapsulation layer by Cu electrodeposition

Published:2018-09 Issue: Volume:453 Page:31-36
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Chu Kunmo,Bae Ki Deok,Song Byong Gwon,Kim Jaekwan,Park Yong Young,Xianyu Wenxu,Lee Chang Seung,Sohn Yoonchul

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference22 articles.

1. Two-layer organic photovoltaic cell;Tang;Appl. Phys. Lett.,1986

2. Ionically assisted charge injection in hybrid organic−inorganic light-emitting diodes;Bolink;ACS Appl. Mater. Inter.,2010

3. Macromolecular electronic device: field-effect transistor with a polythiophene thin film;Tsumura;Appl. Phys. Lett.,1986

4. Lorenza L. Moro, Todd A. Krajewski, Nicole M. Rutherford, Olga Philips, Robert J. Visser, et al., Process and design of a multilayer thin film encapsulation of passive matrix OLED displays, in: Proc. SPIE 5214, Organic Light-Emitting Materials and Devices VII, 83 (February 16, 2004), doi: 10.1117/12.506549.

5. Recent progress on thin-film encapsulation technologies for organic electronic devices;Yu;Opt. Comm.,2016

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