Thermoelectric properties of V2O5 thin films deposited by thermal evaporation-Reference-Cited by-同舟云学术

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Thermoelectric properties of V2O5 thin films deposited by thermal evaporation

Published:2013-10 Issue: Volume:282 Page:590-594
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Santos R.,Loureiro J.,Nogueira A.,Elangovan E.,Pinto J.V.,Veiga J.P.,Busani T.,Fortunato E.,Martins R.,Ferreira I.

Funder

FCT-MEC

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference22 articles.

1. A review of the growth of V2O5 films from 1885 to 2010;Beke;Thin Solid Films,2011

2. Effect of annealing temperature on the supercapacitor behaviour of β-V2O5 thin films;Jeyalakshmi;Materials Research Bulletin,2013

3. A porous vanadium pentoxide nanomaterial as cathode material for rechargeable lithium batteries;Yu;Electrochimica Acta,2013

4. The O–V (oxygen–vanadium) system;Wriedt;Bulletin of Alloy Phase Diagrams,1989

5. A novel single chip thin film metal oxide array;Wöllenstein;Sensors and Actuators B: Chemical,2003

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