Defining the nature of adventitious carbon and improving its merit as a charge correction reference for XPS-Reference-Cited by-同舟云学术

Defining the nature of adventitious carbon and improving its merit as a charge correction reference for XPS

Published:2024-04 Issue: Volume:653 Page:159319
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Grey Lauren H.^ORCID,Nie Heng-Yong^ORCID,Biesinger Mark C.^ORCID

Funder

Natural Sciences and Engineering Research Council of Canada

Western University

Publisher

Elsevier BV

Reference43 articles.

1. J.F. Moulder, W.F. Stickle, P.E. Sobal, K.D. Bomben, Handbook of X-ray Photoelectron Spectroscopy, Perkin-Elmer Corp., Eden Prairie, MN, 1992, pp. 22-23.

2. Spectroscopic Techniques: X-ray Photoelectron Spectroscopy, Auger Electron Spectroscopy, and Ion Scattering Spectroscopy;Hoflund,1998

3. Analysing Insulators with XPS and AES;Kelly,2003

4. ASTM International, Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy, West Conshohocken, PA, 2016.

5. XPS guide: Charge neutralization and binding energy referencing for insulating samples

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