Analysis of vertical phase distribution in reactively sputtered zinc oxysulfide thin films-Reference-Cited by-同舟云学术

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Analysis of vertical phase distribution in reactively sputtered zinc oxysulfide thin films

Published:2019-08 Issue: Volume:486 Page:555-560
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Cho Dae-Hyung^ORCID,Lee Woo-Jung,Shin Byungha,Chung Yong-Duck^ORCID

Funder

National Research Foundation

Korea Institute of Energy Technology Evaluation and Planning

Ministry Of Trade, Industry & Energy

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference40 articles.

1. Thermal stability of sol–gel p-type Al–N codoped ZnO films and electric properties of nanostructured ZnO homojunctions fabricated by spin-coating them on ZnO nanorods;Yang;Acta Mater.,2012

2. Stacking-order-dependent optoelectronic properties of bilayer Nanofilm photodetectors made from hollow ZnS and ZnO microspheres;Hu;Adv. Mater.,2012

3. Large-scale hexagonal-patterned growth of aligned ZnO nanorods for nano-optoelectronics and nanosensor arrays;Wang;Nano Lett.,2004

4. Thin-film transistor fabricated in single-crystalline transparent oxide semiconductor;Nomura;Science,2003

5. Transparent ZnO thin-film transistor fabricated by rf magnetron sputtering;Carcia;Appl. Phys. Lett.,2003

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